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View Electronic characterization of defects in narrow gap semiconductors By James D. Patterson

Electronic characterization of defects in narrow gap semiconductors

Electronic characterization of defects in narrow gap semiconductors

By James D. Patterson

View Strain aging behavior in NiAl microalloyed with interstitial and substitutional solutes By M. L. Weaver

Strain aging behavior in NiAl microalloyed with interstitial and substitutional solutes

Strain aging behavior in NiAl microalloyed with interstitial and substitutional solutes

By M. L. Weaver