Electronic characterization of defects in narrow gap semiconductors

An edition of Electronic characterization of defects in narrow gap semiconductors (1994)

Electronic characterization of defects in narrow gap semiconductors

final report, November 25, 1992 to November 25, 1994

By James D. Patterson

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Publish Date

1994

Publisher

[National Aeronautics and Space Administration], George C. Marshall Space Flight Center,National Technical Information Service, distributor

Language

eng

Pages

Description:

subjects: Crystal defects, Electron energy, Energy levels, Energy of formation, Impurities, Interstitials, Mercury cadmium tellurides, Mercury tellurides, Semiconductors (Materials), Vacancies (Crystal defects), Zinc selenides, Zinc tellurides