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junctions

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View Internal Photoemission Spectroscopy By Valeri V. Afanas'ev
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Internal Photoemission Spectroscopy

By Valeri V. Afanas'ev

View A priori Wire Length Estimates for Digital Design By Dirk Stroobandt
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A priori Wire Length Estimates for Digital Design

By Dirk Stroobandt

View MOS Interface Physics Process and Characterization By Shengkai Wang,Xiaolei Wang
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MOS Interface Physics Process and Characterization

By Shengkai Wang,Xiaolei Wang

View Handbook of semiconductor interconnection technology By Geraldine Cogin Shwartz,Geraldine C. Schwartz,Kris V. Srikrishnan
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Handbook of semiconductor interconnection technology

By Geraldine Cogin Shwartz,Geraldine C. Schwartz,Kris V. Srikrishnan

View Advances in research and development By Maurice H. Francombe,John L. Vossen
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Advances in research and development

By Maurice H. Francombe,John L. Vossen

View Semiconductor surfaces and interfaces By Winfried Mönch
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Semiconductor surfaces and interfaces

By Winfried Mönch

View Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics--2004 By R. J. Carter
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Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics--2004

By R. J. Carter

View Tunnelling and negative resistance phenomena in semiconductors By D. K. Roy
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Tunnelling and negative resistance phenomena in semiconductors

By D. K. Roy

View Materials, technology and reliability of low-k dielectrics and copper interconnects By Symposium F, "Materials, Technology and Reliability of Low-K Dielectrics and Copper Interconnects" (2006 San Francisco, Calif.)

Materials, technology and reliability of low-k dielectrics and copper interconnects

Materials, technology and reliability of low-k dielectrics and copper interconnects

By Symposium F, "Materials, Technology and Reliability of Low-K Dielectrics and Copper Interconnects" (2006 San Francisco, Calif.)

View Copper-fundamental mechanisms for microelectronic applications By S. P Murarka,Shyam P. Murarka,Igor V. Verner,Ronald J. Gutmann
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Copper-fundamental mechanisms for microelectronic applications

By S. P Murarka,Shyam P. Murarka,Igor V. Verner,Ronald J. Gutmann

View Control of semiconductor interfaces By International Symposium on Control of Semiconductor Interfaces (1st 1993 Karuizawa, Japan),I. Ohdomari,M. Oshima

Control of semiconductor interfaces

Control of semiconductor interfaces

By International Symposium on Control of Semiconductor Interfaces (1st 1993 Karuizawa, Japan),I. Ohdomari,M. Oshima

View Interconnect analysis and synthesis By Chung-Kuan Cheng,John Lillis,Shen Lin,Norman Chang
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Interconnect analysis and synthesis

By Chung-Kuan Cheng,John Lillis,Shen Lin,Norman Chang

View Thin films By Maurice H. Francombe
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Thin films

By Maurice H. Francombe

View Superconductor/Semiconductor Junctions By Thomas Schäpers
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Superconductor/Semiconductor Junctions

By Thomas Schäpers

View Interconnects in VLSI design By Hartmut Grabinski

Interconnects in VLSI design

Interconnects in VLSI design

By Hartmut Grabinski

View Materials, technology and reliability for advanced interconnects and low-k dielectrics, 2003 By Symposim E, "Materials, Technology, and Reliability for Advanced Interconnects and Low-k Dielectrics" (2003 San Francisco, Calif.)
Cover of Materials, technology and reliability for advanced interconnects and low-k dielectrics, 2003 by symposim e, "materials, technology, and reliability for advanced interconnects and low-k dielectrics" (2003 san francisco, calif.)

Materials, technology and reliability for advanced interconnects and low-k dielectrics, 2003

By Symposim E, "Materials, Technology, and Reliability for Advanced Interconnects and Low-k Dielectrics" (2003 San Francisco, Calif.)

View Extended abstracts of the First International Workshop on Junction Technology By International Workshop on Junction Technology (1st 2000 Makuhari, Japan)
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Extended abstracts of the First International Workshop on Junction Technology

By International Workshop on Junction Technology (1st 2000 Makuhari, Japan)

View Proceedings of the IEEE 2002 International Interconnect Technology Conference By IEEE International Interconnect Technology Conference (2002 Burlingame, Calif.)
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Proceedings of the IEEE 2002 International Interconnect Technology Conference

By IEEE International Interconnect Technology Conference (2002 Burlingame, Calif.)

View Proceedings of the 16th Conference on High Magnetic Fields in Semiconductor Physics (SemiMag16) By International Conference on High Magnetic Fields in Semiconductor Physics (16th 2004 Tallahassee, Fla.)
Cover of Proceedings of the 16th Conference on High Magnetic Fields in Semiconductor Physics (SemiMag16) by international conference on high magnetic fields in semiconductor physics (16th 2004 tallahassee, fla.)

Proceedings of the 16th Conference on High Magnetic Fields in Semiconductor Physics (SemiMag16)

By International Conference on High Magnetic Fields in Semiconductor Physics (16th 2004 Tallahassee, Fla.)

View Semiconductor liquid-junction solar cells By Conference on the Electrochemistry and Physics of Semiconductor Liquid Interfaces under Illumination Airlie, Va. 1977.

Semiconductor liquid-junction solar cells

Semiconductor liquid-junction solar cells

By Conference on the Electrochemistry and Physics of Semiconductor Liquid Interfaces under Illumination Airlie, Va. 1977.

View Metal-Semiconductor Interfaces, By A. Hiraki
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Metal-Semiconductor Interfaces,

By A. Hiraki

View Low temperature detectors By International Workshop on Low Temperature Detectors (9th 2001 Madison, Wis.)
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Low temperature detectors

By International Workshop on Low Temperature Detectors (9th 2001 Madison, Wis.)

View Microvias By John H. Lau,S.W. Ricky Lee
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Microvias

By John H. Lau,S.W. Ricky Lee

View Materials, technology and reliability for advanced interconnects and low-k dielectrics By Karen Maex
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Materials, technology and reliability for advanced interconnects and low-k dielectrics

By Karen Maex