1-12 of 12 Books

VLSI and Post-CMOS Electronics
By Rohit Dhiman,Rajeevan Chandel
W-band free space permittivity measurement setup for candidate radome materials
W-band free space permittivity measurement setup for candidate radome materials
By Dion T. Fralick
W-band transmission measurements and X-band dielectric properties measurements for a radome material sample
W-band transmission measurements and X-band dielectric properties measurements for a radome material sample
By Robin L. Cravey
Microstructural characterization of semi-interpenetrating polymer networks by positron lifetime spectroscopy
Microstructural characterization of semi-interpenetrating polymer networks by positron lifetime spectroscopy
By Jag J. Singh
A study of physical properties of ODPA-p-PDA polyimide films
A study of physical properties of ODPA-p-PDA polyimide films
By Jag J. Singh
Role of dielectric constant in electrohydrodynamics of conducting fluids
Role of dielectric constant in electrohydrodynamics of conducting fluids
By Percy H. Rhodes
Complex permittivities of candidate radome materials at W-band
Complex permittivities of candidate radome materials at W-band
By Robin L. Cravey
Application of FEM to estimate complex permittivity of dielectric material at microwave frequency using waveguide measurements
Application of FEM to estimate complex permittivity of dielectric material at microwave frequency using waveguide measurements
By M. D. Deshpande
Modified Hilbert transform pair and Kramers-Kronig relations for complex permittivities
Modified Hilbert transform pair and Kramers-Kronig relations for complex permittivities
By C. R. Cockrell
Technique for measuring the dielectic constant of thin materials
Technique for measuring the dielectic constant of thin materials
By K. Saraband
Effects of specimen preparation on the accuracy of electromagnetic property measurements of solid materials with an automatic network analyzer
Effects of specimen preparation on the accuracy of electromagnetic property measurements of solid materials with an automatic network analyzer
By Edward R. Long
W-band transmission measurements and X-band dielectric properties measurements for a radome material sample
W-band transmission measurements and X-band dielectric properties measurements for a radome material sample
By Robin Lee Cravey