Explore Books on
random access memory

Dynamic Ram

By Muzaffer A. Siddiqi

Mega-Bit Memory Technology - from Mega-Bit to Giga-Bit

By Hiroyuki Tango

Thin film ferroelectric materials and devices

By R. Ramesh

Testing static random access memories

By Said Hamdioui

Emerging Memory Technologies

By Yuan Xie

Nanometer VariationTolerant Sram

By Mohab Anis

Proceedings

By IEEE International Workshop on Memory Technology, Design, and Testing (1997 San Jose, Calif.)

BCH codes for large IC random-access memory systems

By Shu Lin

64K dynamic random access memory components from Japan

By United States International Trade Commission

Static random access memory semiconductors from the Republic of Korea and Taiwan

By United States International Trade Commission

DOS beyond 640K

By James Forney

DRAM circuit design

By Brent Keeth,Brian Johnson,Lin, Feng

Turing's cathedral

By George Dyson

Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France

By IEEE International Workshop on Memory Technology, Design and Testing (10th 2002 Isle of Bendor, France)

DRAMs of one megabit and above from the Republic of Korea

By United States International Trade Commission.

Memory technology, design and testing

By IEEE International Workshop on Memory Technology, Design, and Testing (1998 San Jose, California)

DRAMs of one megabit and above from the Republic of Korea

By United States International Trade Commission

Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing

By IEEE International Workshop on Memory Technology, Design and Testing (8th 2000 San Jose, Calif.)

Steuerwerke

By Werner Grass

Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California

By IEEE International Workshop on Memory Technology, Design and Testing (11th 2003 San Jose, Calif.)

MTDT 2004

By IEEE International Workshop on Memory Technology, Design and Testing (12th 2004 San Jose, Calif.)

Using disk and RAM utilities

By Ian Robertson Sinclair

2006 IEEE International Workshop on Memory Technology, Design, and Testing: 2-4 August 2006, Taipei, Taiwan

By IEEE Computer Society

The design of random access data files & data bases

By Professional Development Workshop Monash University, Melbourne 1971.