1-24 of 63 Books
Mega-Bit Memory Technology - from Mega-Bit to Giga-Bit
Mega-Bit Memory Technology - from Mega-Bit to Giga-Bit
By Hiroyuki Tango

Testing static random access memories
By Said Hamdioui

Thin film ferroelectric materials and devices
By R. Ramesh
BCH codes for large IC random-access memory systems
BCH codes for large IC random-access memory systems
By Shu Lin

Proceedings
By IEEE International Workshop on Memory Technology, Design, and Testing (1997 San Jose, Calif.)

Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France
By IEEE International Workshop on Memory Technology, Design and Testing (10th 2002 Isle of Bendor, France)
DRAMs of one megabit and above from the Republic of Korea
DRAMs of one megabit and above from the Republic of Korea
By United States International Trade Commission.
64K dynamic random access memory components from Japan
64K dynamic random access memory components from Japan
By United States International Trade Commission
DRAMs of one megabit and above from the Republic of Korea
DRAMs of one megabit and above from the Republic of Korea
By United States International Trade Commission

Memory technology, design and testing
By IEEE International Workshop on Memory Technology, Design, and Testing (1998 San Jose, California)

DRAM circuit design
By Brent Keeth,Brian Johnson,Lin, Feng
Static random access memory semiconductors from the Republic of Korea and Taiwan
Static random access memory semiconductors from the Republic of Korea and Taiwan
By United States International Trade Commission
2005 IEEE International Workshop on Memory Technology, Design, and Testing Mtdt 2005, 3-5 August 2005, Taipei, Taiwan
2005 IEEE International Workshop on Memory Technology, Design, and Testing Mtdt 2005, 3-5 August 2005, Taipei, Taiwan
By Ieee International Workshop on Memory Te
New DRAM technologies
New DRAM technologies
By Steven A. Przybylski

Memory Technology, Design and Testing (Mtdt '99), 1999 IEEE International Workshop on
By Institute of Electrical and Electronics Engineers
The design of random access data files & data bases
The design of random access data files & data bases
By Professional Development Workshop Monash University, Melbourne 1971.

Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California
By IEEE International Workshop on Memory Technology, Design, and Testing (1995 San Jose, Calif.)
Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California
Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California
By IEEE International Workshop on Memory Technology, Design and Testing (11th 2003 San Jose, Calif.)

Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing
By IEEE International Workshop on Memory Technology, Design and Testing (8th 2000 San Jose, Calif.)