MTDT 2004

records of the 2004 International Workshop on Memory Technology, Design and Testing : 9-10 August, 2004, San Jose, California, USA

By IEEE International Workshop on Memory Technology, Design and Testing (12th 2004 San Jose, Calif.)

0 (0 Ratings)

0 Want to read0 Currently reading0 Have read

Publish Date

2004

Publisher

IEEE Computer Society

Language

eng

Pages

121

Description:

subjects: Congresses, Random access memory, Semiconductor storage devices, Testing