1-4 of 4 Books
Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
By Victor A. Carreño
Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
By Victor A. Carreno
Upper bound SEU rate for devices in an isotropic or nonisotropic flux
Upper bound SEU rate for devices in an isotropic or nonisotropic flux
By Larry D. Edmonds
The single event effect characteristics of the 486-DX4 microprocessor
The single event effect characteristics of the 486-DX4 microprocessor
By Coy Kouba