Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system

An edition of Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system (1990)

Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system

By Victor A. Carreno

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Publish Date

1990

Publisher

National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division,National Technical Information Service, distributor]

Language

eng

Pages

Description:

subjects: Errors, Avionics, Digital simulation, Latch-up, Error analysis, Logic programming, Control system, Analog simulation, Fault tolerance, Single event upsets