1-24 of 27 Books
Semiconductor Radiation Detectors
Semiconductor Radiation Detectors
By Alan Owens
Compound semiconductor radiation detectors
Compound semiconductor radiation detectors
By Alan Owens
Analysis of yttrium-barium-copper-oxide by x-ray diffraction and mechanical characterization
Analysis of yttrium-barium-copper-oxide by x-ray diffraction and mechanical characterization
By Peter Arsenovic

Transmission electron microscopy and diffractometry of materials
By B. Fultz,James M. Howe,Brent Fultz

Transmission electron microscopy and diffractometry of materials
By B. Fultz,Brent Fultz,James M. Howe

High Resolution Powder Diffraction (Materials Science Forum,)
By Ed Catlow
X-ray mineralogy and physical properties of antrim shale samples from Sanilac Co., Michigan
X-ray mineralogy and physical properties of antrim shale samples from Sanilac Co., Michigan
By William A. Hockings
Radiation safety for X-ray diffraction and fluorescence analysis equipment
Radiation safety for X-ray diffraction and fluorescence analysis equipment
By American National Standards Institute. Subcommittee N43-1.
X-ray mineralogy and physical properties of antrim shale samples from Sanilac Co., Michigan
X-ray mineralogy and physical properties of antrim shale samples from Sanilac Co., Michigan
By William A Hockings
Advances in x-ray diffractometry and x-ray spectrography
Advances in x-ray diffractometry and x-ray spectrography
By
A standard reference material containing nominally fifteen percent austenite (SRM 486)
A standard reference material containing nominally fifteen percent austenite (SRM 486)
By C. G. Interrante
The lunar and planetary X-ray diffraction program
The lunar and planetary X-ray diffraction program
By James A. Dunne
A standard reference material containing 2.5 percent austenite (SRM 488)
A standard reference material containing 2.5 percent austenite (SRM 488)
By G. E. Hicho
A standard reference material containing nominally five percent austenite (SRM 485a)
A standard reference material containing nominally five percent austenite (SRM 485a)
By G. E. Hicho
A standard reference material containing nominally thirty percent austenite (SRM 487)
A standard reference material containing nominally thirty percent austenite (SRM 487)
By G. E. Hicho
"Buried" interface science with x-rays and neutrons
"Buried" interface science with x-rays and neutrons
By Japan) Workshop on "Buried" Interface Science with X-rays and Neutrons (2006 Yokohama-shi

Difraktometrii︠a︡ s ispolʹzovaniem sinkhrotronnogo izluchenii︠a︡
By V. V. Boldyrev
Separation and identification of the silt-sized heavy-mineral fraction in sediments
Separation and identification of the silt-sized heavy-mineral fraction in sediments
By Judith A. Commeau
Concerns about a variance approach to the X-ray diffractometric estimation of microfibril angle in wood
Concerns about a variance approach to the X-ray diffractometric estimation of microfibril angle in wood
By S. P. Verrill

X-ray multilayers for diffractometers, monochromators, and spectrometers
By SPIE
Aspekty tochnosti v difraktometrii polikristallov
Aspekty tochnosti v difraktometrii polikristallov
By V. I. Lisoĭvan
Dinamicheskoe rassei͡anie rentgenovskikh lucheĭ realʹnymi kristallami
Dinamicheskoe rassei͡anie rentgenovskikh lucheĭ realʹnymi kristallami
By L. I. Dat͡senko
Methodik der Vielkristall-Röntgendiffraktometrie
Methodik der Vielkristall-Röntgendiffraktometrie
By

Introduction to X-ray powder diffractometry
By Ron Jenkins