An edition of Transmission electron microscopy and diffractometry of materials (2002)
Transmission Electron Microscopy and Diffractometry of Materials
By B. Fultz,Brent Fultz,James M. Howe
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Publish Date
March 14, 2005
Publisher
Springer
Language
eng
Pages
759
Description:
subjects: Materials, Microscopy, Transmission electron microscopy, X-ray diffractometer, Applied physics & special topics, Testing Of Materials, Electron Microscopy, Science, Science/Mathematics, Nanostructures, Engineering - General, Physics, Diffraction, Imaging, Materials characterization, Spectroscopy, Technology / Material Science, Transmission electron microsco, Electron Microscopes & Microscopy, Material Science