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Error analysis and calibration uncertainty of capacitance standards at NIST

Error analysis and calibration uncertainty of capacitance standards at NIST

By Y. May Chang

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Publish Date

2000

Publisher

U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,For sale by the Supt. of Docs., U.S. G.P.O.

Language

eng

Pages

-

Description: