Error analysis and calibration uncertainty of capacitance standards at NIST
An edition of Error analysis and calibration uncertainty of capacitance standards at NIST (2000)
By Y. May Chang
Publish Date
2000
Publisher
U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,For sale by the Supt. of Docs., U.S. G.P.O.
Language
eng
Pages
-
Description:
subjects: Capacitance meters, Calibration, Electric capacity, Standards
Places: United States