Error analysis and calibration uncertainty of capacitance standards at NIST

An edition of Error analysis and calibration uncertainty of capacitance standards at NIST (2000)

Error Analysis and Calibration Uncertainty of Capacitance Standards at NIST

By Y. May Chang

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Publish Date

2000

Publisher

United States Government Printing Office

Language

eng

Pages

Description:

subjects: Capacitance meters, Calibration, Electric capacity, Standards

Places: United States