

An edition of Data-driven methods for fault detection and diagnosis in chemical processes (2000)
By Evan Russell,Evan L. Russell,Leo H. Chiang,Richard D. Braatz
Publish Date
March 30, 2000
Publisher
Springer
Language
eng
Pages
192
Description:
subjects: Chemical process control, Data processing, Fault location (Engineering), Data capture & analysis, Industrial chemistry, Technology, Engineering - Industrial, Chemical Engineering Operations, Reliability Engineering, Technology & Industrial Arts, Science/Mathematics, Computer Science, Engineering - Chemical & Biochemical, Computers-Computer Science, Science / Chemistry / Technical & Industrial, Technology / Engineering / Chemical & Biochemical, Technology-Engineering - Industrial, Quality Control, Production engineering, Chemical processes