An edition of 2001 IEEE International Integrated Reliability Workshop Final Report (2001)
2001 IEEE International Integrated Reliability Workshop Final Report
Stanford Sierra Camp, Lake Tahoe, California, October 15-18, 2001
By International Integrated Reliability Workshop (2001 Lake Tahoe, Calif.)
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Publish Date
2001
Publisher
IEEE Electron Devices Society,IEEE Reliability Society
Language
eng
Pages
106
Description:
subjects: Reliability, Congresses, Integrated circuits, Wafer-scale integration