1-24 of 46 Books

1998 IEEE International Integrated Reliability Workshop final report
By International Integrated Reliability Workshop (1998 Lake Tahoe, Calif.),IEEE Reliability Society,Institute of Electrical and Electronics Engineers,IEEE Electron Devices Society,Ieee Reliability Society

1996 International Integrated Reliability Workshop final report
By International Integrated Reliability Workshop (1996 Lake Tahoe, California),Calif.) International Integrated Reliability Workshop (2001 : Lake Tahoe,California) International Integrated Reliability Workshop (1996 : Lake Tahoe

Handbook of quality integrated circuit manufacturing
By Robert Zorich

1994 International Integrated Reliability Workshop final report
By International Integrated Reliability Workshop (1994 Lake Tahoe, Calif.)

1997 IEEE International Integrated Reliability Workshop final report
By International Integrated Reliability Workshop (1997 Lake Tahoe, California)

1990 Proceedings
By International Conference on Wafer Scale Integration. (2nd 1990 San Francisco, Calif.)

2005 Electronics and Photonic Packaging, Electrical Systems Design and Photonics, and Nanotechnology (EPP)
By American Society of Mechanical Engineers

1991 proceedings
By International Conference on Wafer Scale Integration (3rd 1991 San Francisco, Calif.),Calif.) International Conference on Wafer Scale Integration (3rd : 1991 : San Francisco,Michael J. Little

Tutorial on Manufacturing Yield Evaluation of Vlsi/Wsi Systems
By Bruno Ciciani

Seventh annual IEEE International Conference on Wafer Scale Integration, San Francisco, California, USA
By International Conference on Wafer Scale Integration (7th 1995 San Francisco, Calif.)
Semiconductor measurement technology
Semiconductor measurement technology
By W. Murray Bullis

1994 Proceedings
By International Conference on Wafer Scale Integration. (6th 1994 San Francisco, Calif.)

2001 IEEE International Integrated Reliability Workshop Final Report
By International Integrated Reliability Workshop (2001 Lake Tahoe, Calif.)

1991 Proceedings
By International Conference on Wafer Scale Integration. (3rd 1991 San Francisco, Calif.)
1993 Proceedings
1993 Proceedings
By International Conference on Wafer Scale Integration. (5th 1993 San Francisco, Calif.)

2000 IEEE International Integrated Reliability Workshop final report
By International Integrated Reliability Workshop (2000 Lake Tahoe, Calif.)

Fault-tolerance through reconfiguration of VLSI and WSI arrays
By R. Negrini

Wafer-level integrated systems
By Stuart K. Tewksbury

Wafer scale integration, III
By IFIP WG 10.5 Workshop on Wafer Scale Integration (3rd 1989 Como, Italy)

2001 IEEE International Integrated Reliability Workshop Final Report
By Calif.) International Integrated Reliability Workshop (2001 : Lake Tahoe

1995 International Integrated Reliability Workshop Final Report
By Ieee Reliability Society

2003 IEEE International Integrated Reliability Workshop Final Report
By IEEE Reliability Society