An edition of 1997 IEEE International Conference on Microelectronic Test Structures proceedings (1997)
1997 IEEE International Conference on Microelectronics Test Structures Proceedings
March 17-20, 199Y, Monterey, California
By IEEE International Conference on Microelectronic Test Structures (1997 Monterey, Calif.),Institute of Electrical and Electronics Engineers,IEEE Electron Devices Society
Publish Date
April 1997
Publisher
Institute of Electrical & Electronics Enginee
Language
eng
Pages
225
Description:
subjects: Congresses, Testing, Microelectronics, Integrated circuits, Electronic devices & materials, Engineering measurement & calibration, Electronic Measurements, Technology & Engineering, Technology & Industrial Arts, Science/Mathematics, Electricity, Engineering - Electrical & Electronic, Electronics - Microelectronics