Explore Books on
electronics - microelectronics
1-24 of 89 Books
Nanotechnology
By Ben Rogers,Ben Rogers,Sumita Pennathur,Jesse Adams
Micromechatronics
By Victor Giurgiutiu,Sergey E. Lyshevski
Microstructural characterization of materials
By D. G. Brandon,David D. Brandon,Wayne D. Kaplan
Electromagnetic theory for microwaves and optoelectronics
By Keqian Zhang,Dejie Li
Introduction to nanoscience and nanotechnology
By G. Louis Hornyak,H.F. Tibbals,Joydeep Dutta
Microelectronic design of fuzzy logic-based systems
By I. Baturone,Iluminada Baturone,Angel Barriga,Carlos Jimenez-Fernandez,Diego R. Lopez,Santiago Sanchez-Solano
Low-power NoC for high-performance SoC design
By Hoi-Jun Yoo,Kangmin Lee,Jun Kyong Kim
Plasma-aided nanofabrication
By K. Ostrikov,Ken Ostrikov,Shuyan Xu
Introduction to microsystem technology
By Gerald Gerlach,Wolfram Dotzel
Impulse breakdown of liquids
By V. F. Klimkin,S. M. Korobeynikov
Modeling MEMS and NEMS
By John A. Pelesko,David H. Bernstein
IEEE, the Eleventh Annual International Workshop on Micro Electro Mechanical Systems
IEEE, the Eleventh Annual International Workshop on Micro Electro Mechanical Systems
By IEEE Workshop on Micro Electro Mechanical Systems (11th 1998 Heidelberg, Germany),Germany) IEEE Workshop on Micro Electro Mechanical Systems (11th : 1998 : Heidelberg,Institute of Electrical and Electronics Engineers
Micromechatronics modeling, analysis, and design with MATLAB
By Victor Giurgiutiu,Sergey Edward Lyshevski
On-chip communication architectures
By Sudeep Pasricha,Nikil Dutt
Verification techniques for system-level design
By Masahiro Fujita,Masahiro Fujita,Indradeep Ghosh,Mukul Prasad
ESD protection device and circuit design for advanced CMOS technologies
By Oleg Semenov
Silicon-germanium strained layers and heterostructures
By Jain, S. C.,M. Willander,Suresh Jain
Workshop record
By IEEE Radiation Effects Data Workshop (1997 Snowmass Village, Colorado),IEEE Nuclear & Plasma Science Society,Th&&&&
Proceedings of 2nd Electronic Packaging Technology Conference
By Electronic Packaging Technology Conference (2nd 1998 Singapore),Electronic Packaging Technology Conference (2nd : 1998 : Singapore),Thiam Beng Lim
1996 International Integrated Reliability Workshop final report
By International Integrated Reliability Workshop (1996 Lake Tahoe, California),Calif.) International Integrated Reliability Workshop (2001 : Lake Tahoe,California) International Integrated Reliability Workshop (1996 : Lake Tahoe
Scanning probe lithography
By Hyongsok T. Soh,Kathryn Wilder Guarini,Calvin F. Quate