An edition of Reliability wearout mechanisms in advanced CMOS technologies (2008)
Reliability wearout mechanisms in advanced CMOS technologies
By Alvin Wayne Strong,Alvin W. Strong,Ernest Y. Wu,Rolf-peter Vollertsen,Jordi Sune,Guiseppe La Rosa
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Publish Date
2009
Publisher
IEEE Press,Wiley
Language
eng
Pages
624
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