An edition of Reliability wearout mechanisms in advanced CMOS technologies (2008)
Reliability wearout mechanisms in advanced CMOS technologies
By Alvin Wayne Strong,Alvin W. Strong,Ernest Y. Wu,Rolf-peter Vollertsen,Jordi Sune,Guiseppe La Rosa
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Publish Date
2009
Publisher
IEEE Press,Wiley
Language
eng
Pages
624
1-3 of 3 Editions
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Language: eng
Pages: 864
Published In: 2009
Publisher: Wiley & Sons, Incorporated, John
Reliability Wearout Mechanisms in Advanced CMOS Technologies (Ieee Press Series on Microelectronic Systems)
Reliability Wearout Mechanisms in Advanced CMOS Technologies (Ieee Press Series on Microelectronic Systems)
Language: eng
Pages: 576
Published In: April 22, 2008
Publisher: Ieee
Reliability wearout mechanisms in advanced CMOS technologies
Language: eng
Pages: 624
Published In: 2009
Publisher: IEEE Press, Wiley