An edition of Electromigration in thin films and electronic devices (2011)

Electromigration in thin films and electronic devices

materials and reliability

By Choong-Un Kim

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Publish Date

2011

Publisher

Woodhead Publishing

Language

eng

Pages

352

Description:

subjects: Electrodiffusion, Integrated circuits, Deterioration, Thin films, Interconnects (Integrated circuit technology), Diffusion, Couches minces, TECHNOLOGY & ENGINEERING, Mechanical