1-24 of 31 Books

Electromigration in thin films and electronic devices
By Choong-Un Kim

Materials Reliability in Microelectronics II
By C. V. Thompson

Materials Reliability in Microelectronics V (Symposium Proceedings Series; Volume 391)
By A. S. Oates

Materials Reliability in Microelectronics III
By Kenneth P. Rodbell

Stress-induced phenomena in metallization
By International Workshop on Stress-Induced Phenomena in Metallization (7th 2004 Austin, Tex.)

Stress-induced phenomena in metallization
By International Workshop on Stress-Induced Phenomena in Metallization (6th 2001 Ithaca, N.Y.)

Materials reliability in microelectronics IV
By William F. Filter,Kenneth P. Rodbell

Proceedings of the Symposium on Reliability of Metals in Electronics
By Symposium on Reliability of Metals in Electronics (1995 Reno, Nev.)
Termodynamiczne podstawy magnetotermodyfuzji i elektrotermodyfuzji w ośrodku ciągłym
Termodynamiczne podstawy magnetotermodyfuzji i elektrotermodyfuzji w ośrodku ciągłym
By Bogdan Maruszewski
Electrotransport in metals and alloys
Electrotransport in metals and alloys
By John N. Pratt
Proceedings of the Symposium on Electromigration of Metals and First International Symposium on Multilevel Metallization and Packaging
Proceedings of the Symposium on Electromigration of Metals and First International Symposium on Multilevel Metallization and Packaging
By Symposium on Electromigration of Metals (1984 New Orleans, La.)
Ėlektrodiffuzionnai͡a︡ diagnostika techeniĭ v suspenzii͡a︡kh i polimernykh rastvorakh
Ėlektrodiffuzionnai͡a︡ diagnostika techeniĭ v suspenzii͡a︡kh i polimernykh rastvorakh
By N. A. Pokryvaĭlo
Advanced Ta-based diffusion barriers for Cu interconnects
Advanced Ta-based diffusion barriers for Cu interconnects
By Rene Hubner
Electromigration behavior of a multi-layer metallization (Series in microelectronics)
Electromigration behavior of a multi-layer metallization (Series in microelectronics)
By Edgar Arthur Schonbachler
O priblizhenii ėlektroneĭtralʹnosti v zadachakh ėlektrodiffuzii
O priblizhenii ėlektroneĭtralʹnosti v zadachakh ėlektrodiffuzii
By E. V. Nikolaev
Isotope enrichment by countercurrent electromigration in molten salts
Isotope enrichment by countercurrent electromigration in molten salts
By Arnold Lundeń
Electromigration behavior of a multi-layer metallization
Electromigration behavior of a multi-layer metallization
By Edgar Arthur Schönbächler
Theory and practice of diffusion with an application to reaction kinetics
Theory and practice of diffusion with an application to reaction kinetics
By Stig Ljunggren
Electromigration in ULSI Interconnections
Electromigration in ULSI Interconnections
By Cher Ming Tan

The electromigration- and temperature-induced structural behavior of gold thin films based upon alkali additions
By Susan Matts Goho

Electro-Diffusion of Ions (Studies in Applied and Numerical Mathematics)
By Isaak Rubinstein
Electromigration and proton-Hall effect in metalhydrides
Electromigration and proton-Hall effect in metalhydrides
By Ad H. Verbruggen
Electronic diffusion and localization in disordered systems
Electronic diffusion and localization in disordered systems
By Gary Michael Scher