Cover of Power-constrained testing of VLSI circuits

An edition of Power-constrained testing of VLSI circuits (2003)

Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)

By Nicola Nicolici

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Publish Date

February 28, 2003

Publisher

Springer

Language

eng

Pages

186

Description:

subjects: Very large scale integration Integrated circuits, Semiconductors, Protection, Testing, Thermal properties, Systems engineering, Engineering, Computer-aided design, Integrated circuits, very large scale integration, Integrated circuits, Very large scale integration