An edition of Power-constrained testing of VLSI circuits (2003)
Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)
By Nicola Nicolici
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Publish Date
February 28, 2003
Publisher
Springer
Language
eng
Pages
186
1-3 of 3 Editions
Power-Constrained Testing of VLSI Circuits
Power-Constrained Testing of VLSI CircuitsA Guide to the IEEE 1149. 4 Test Standard
Language: eng
Published In: 2006
Publisher: Springer London, Limited
Power-Constrained Testing of Vlsi CircuitsA Guide To The Ieee 1149.4 Test Standard
Pages: 192
Published In: Dec 09, 2010
Publisher: Springer
Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)
Language: eng
Pages: 180
Published In: February 28, 2003
Publisher: Springer