An edition of Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces (2011)
Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
By Weronika Walkosz
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Publish Date
2011
Publisher
Springer Science+Business Media, LLC
Language
eng
Pages
124
1-2 of 2 Editions
Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
Pages: 124
Published In: May 28, 2013
Publisher: Springer
Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
Language: eng
Published In: 2011
Publisher: Springer Science+Business Media, LLC