An edition of Advanced characterization techniques for optics, semiconductors, and nanotechnologies (2003)

Advanced characterization techniques for optics, semiconductors, and nanotechnologies

3-5 August 2003, San Diego, California, USA

By Angela Duparré

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Publish Date

2003

Publisher

SPIE

Language

eng

Pages

402

Description:

subjects: Optical properties, Characterization, Semiconductors, Optoelectronics, Thin films, Optoelectronic devices, Congresses, Optical measurements, Nanotechnology