Explore Books on
characterization

Physics and Technology of Crystalline Oxide Semiconductor CAAC-IGZO

By Noboru Kimizuka,Shunpei Yamazaki

On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond

By Andrej Rumiantsev

Characterization Of Semiconductor Heterostructures And Nanostructures

By Carlo Lamberti

Ultrasonic phased-array characterization for NDE applications

By John J. Hanley

Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry

By W. Murray Bullis

IWSM

By International Workshop on Statistical Metrology (3rd 1998 Honolulu, Hawaii),IEEE Electron Devices Society,Institute of Electrical and Electronics Engineers

Washington State septage characterization analysis

By Dustin Bilhimer

Application of artificial neural networks to composite ply micromechanics

By D. A. Brown

Advanced characterization techniques for optics, semiconductors, and nanotechnologies

By Angela Duparré

Analysis and fate of polymers in wastewater treatment

By Steven K. Dentel,Lin-Li Chang,Donna L. Raudenbush,Robert W. Junnier,Mohammad M. Abu-Orf

Trace organics and inorganics in distribution and marketing municipal sludges

By Rodger Baird

IWSM

By International Workshop on Statistical Metrology (4th 1999 Kyoto, Japan),Institute of Electrical and Electronics Engineers,IEEE Electron Devices Society

Health effects of land application of municipal sludge

By Norman Edward Kowal

Methods of characterization of sewage sludge

By T. J. Casey,P. J. Newman

Characterization and cycle tests of lightweight nickel electrodes

By Doris L. Britton

Manual on the causes and control of activated sludge bulking and foaming

By Jenkins, David

Zur Kennzeichnung des Rottegrades von Müll- und Müllklärschlammkomposten

By Bernd Jourdan

Spatially resolved characterization of local phenomena in materials and nanostructures

By Symposium G, "Spatially Resolved Characterization of Local Phenomena in Materials and Devices" (2002 Boston, Mass.)

2001 6th International Workshop on Statistical Methodology

By International Workshop on Statistical Methodology (6th 2001 Kyoto, Japan)

Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II

By SPIE

Microscopic examination of the activated sludge process

By Michael H. Gerardi

Methods for Wastewater Characterization in Activated Sludge Modelling

By H. Melcer

Statistical Metrology 2000 4th International Workshop

By International Workshop on Statistical Metrology (5th : 2000 : Hawaii)

Contact handled transuranic waste characterization requirements at the Waste Isolation Pilot Plant

By Matthew Silva