Explore Books on
characterization

Physics and Technology of Crystalline Oxide Semiconductor CAAC-IGZO

By Noboru Kimizuka,Shunpei Yamazaki

On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond

By Andrej Rumiantsev

Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry

By W. Murray Bullis

Ultrasonic phased-array characterization for NDE applications

By John J. Hanley

Characterization Of Semiconductor Heterostructures And Nanostructures

By Carlo Lamberti

IWSM

By International Workshop on Statistical Metrology (3rd 1998 Honolulu, Hawaii),IEEE Electron Devices Society,Institute of Electrical and Electronics Engineers

Trace organics and inorganics in distribution and marketing municipal sludges

By Rodger Baird

Characterization and cycle tests of lightweight nickel electrodes

By Doris L. Britton

Health effects of land application of municipal sludge

By Norman Edward Kowal

Washington State septage characterization analysis

By Dustin Bilhimer

Application of artificial neural networks to composite ply micromechanics

By D. A. Brown

Methods of characterization of sewage sludge

By T. J. Casey,P. J. Newman

Advanced characterization techniques for optics, semiconductors, and nanotechnologies

By Angela Duparré

Analysis and fate of polymers in wastewater treatment

By Steven K. Dentel,Lin-Li Chang,Donna L. Raudenbush,Robert W. Junnier,Mohammad M. Abu-Orf

IWSM

By International Workshop on Statistical Metrology (4th 1999 Kyoto, Japan),Institute of Electrical and Electronics Engineers,IEEE Electron Devices Society

Manual on the causes and control of activated sludge bulking and foaming

By Jenkins, David

Characterization of cadmium-zinc telluride crystals grown by 'contactless' PVT using synchrotron white beam topography

By W. Palosz

Joint NRC/EPA sewage sludge radiological survey

By Interagency Steering Committee on Radiation Standards (U.S.). Sewage Subcommittee

Launch vehicle design process

By J. C. Blair

Statistical Metrology 2000 4th International Workshop

By International Workshop on Statistical Metrology (5th : 2000 : Hawaii)

Methods for Wastewater Characterization in Activated Sludge Modelling

By H. Melcer

Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II

By SPIE

Simplified data reduction methods for the ECT test for mode III interlaminar fracture toughness

By Jian Li

2001 6th International Workshop on Statistical Methodology

By International Workshop on Statistical Methodology (6th 2001 Kyoto, Japan)