An edition of Materials reliability in microelectronics IV (1994)

Materials Reliability in Microelectronics IV (Mrs Conference Proceedings Series, 4)

By William F. Filter,Kenneth P. Rodbell

0 (0 Ratings)

0 Want to read0 Currently reading0 Have read

Publish Date

March 1999

Publisher

Materials Research Society

Language

eng

Pages

630

Description:

subjects: Reliability, Congresses, Materials, Testing, Microelectronics, Electrodiffusion, Microélectronique, Congrès, Fiabilité, Électromigration, Kongress, Mikroelektronik, Mikrostruktur, Zuverlässigkeit