Cover of Defects in microelectronic materials and devices

An edition of Defects in microelectronic materials and devices (2008)

Defects in Microelectronic Materials and Devices

By Daniel Fleetwood,Sokrates Pantolides,Ronald D. Schrimpf

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Publish Date

September 15, 2008

Publisher

CRC

Language

eng

Pages

762

Description:

subjects: Materials, Defects, Metal oxide semiconductor field-effect transistors, Testing, Microelectronics, Integrated circuits, Circuits intégrés, Défauts, TECHNOLOGY & ENGINEERING, Electronics, Digital, Mikroelektronik, Integrerade kretsar