Tomeki

Explore Books on
défauts

1-24 of 43 Books

View Understanding Building Failures By James Douglas,Bill Ransom
Cover of Understanding Building Failures by james douglas,bill ransom

Understanding Building Failures

By James Douglas,Bill Ransom

View Investigation of Aeronautical and Engineering Component Failures By A. Venugopal Reddy
Cover of Investigation of Aeronautical and Engineering Component Failures by a. venugopal reddy

Investigation of Aeronautical and Engineering Component Failures

By A. Venugopal Reddy

View Extended defects in semiconductors By D. B. Holt
Cover of Extended defects in semiconductors by d. b. holt

Extended defects in semiconductors

By D. B. Holt

View Laser-induced damage of optical materials By Roger M. Wood
Cover of Laser-induced damage of optical materials by roger m. wood

Laser-induced damage of optical materials

By Roger M. Wood

View Defects and Damage in Composite Materials and Structures By Rikard Benton Heslehurst
Cover of Defects and Damage in Composite Materials and Structures by rikard benton heslehurst

Defects and Damage in Composite Materials and Structures

By Rikard Benton Heslehurst

View Alkali-Aggregate Reaction in Concrete By Alan B. Poole,Ian Sims

Alkali-Aggregate Reaction in Concrete

Alkali-Aggregate Reaction in Concrete

By Alan B. Poole,Ian Sims

View Defect Recognition and Image Processing in Semiconductors 1997 By J. Doneker

Defect Recognition and Image Processing in Semiconductors 1997

Defect Recognition and Image Processing in Semiconductors 1997

By J. Doneker

View Random, non-random, and periodic faulting incrystals By M. T. Sebastian,P. Krishna
Cover of Random, non-random, and periodic faulting incrystals by m. t. sebastian,p. krishna

Random, non-random, and periodic faulting incrystals

By M. T. Sebastian,P. Krishna

View Defects in microelectronic materials and devices By Daniel Fleetwood,Sokrates Pantolides,Ronald D. Schrimpf
Cover of Defects in microelectronic materials and devices by daniel fleetwood,sokrates pantolides,ronald d. schrimpf

Defects in microelectronic materials and devices

By Daniel Fleetwood,Sokrates Pantolides,Ronald D. Schrimpf

View Issues of fault diagnosis for dynamic systems By Paul M. Frank
Cover of Issues of fault diagnosis for dynamic systems by paul m. frank

Issues of fault diagnosis for dynamic systems

By Paul M. Frank

View Imperfections in crystals By H. G. van Bueren
Cover of Imperfections in crystals by h. g. van bueren

Imperfections in crystals

By H. G. van Bueren

View Developments in Pressure Vessel Technology By R. W. Nichols
Cover of Developments in Pressure Vessel Technology by r. w. nichols

Developments in Pressure Vessel Technology

By R. W. Nichols

View Light-Induced Defects in Semiconductors By Kazuo Morigaki,Harumi Hikita,Chisato Ogihara

Light-Induced Defects in Semiconductors

Light-Induced Defects in Semiconductors

By Kazuo Morigaki,Harumi Hikita,Chisato Ogihara

View Defects and radiation damage in metals By M. W. Thompson
Cover of Defects and radiation damage in metals by m. w. thompson

Defects and radiation damage in metals

By M. W. Thompson

View Solid state By J. N. Mundy
Cover of Solid state by j. n. mundy

Solid state

By J. N. Mundy

View Atlas of Polymer Damage By Lothar Engel
Cover of Atlas of Polymer Damage by lothar engel

Atlas of Polymer Damage

By Lothar Engel

View Shallow Impurities in Semiconductors, Proceedings of the 3rd INT Conference on Shallow Impurities in Semiconductors held at Linkoping, Sweden, 10-12 August ... (Institute of Physics Conference Series) By Monemar
Cover of Shallow Impurities in Semiconductors, Proceedings of the 3rd INT  Conference on Shallow Impurities in Semiconductors held at Linkoping, Sweden, 10-12 August ... (Institute of Physics Conference Series) by monemar

Shallow Impurities in Semiconductors, Proceedings of the 3rd INT Conference on Shallow Impurities in Semiconductors held at Linkoping, Sweden, 10-12 August ... (Institute of Physics Conference Series)

By Monemar

View Poor-quality cost By H. J. Harrington
Cover of Poor-quality cost by h. j. harrington

Poor-quality cost

By H. J. Harrington

View Dynamics and defects in liquid crystals By P. E. Cladis,P. Palffy-Muhoray
Cover of Dynamics and defects in liquid crystals by p. e. cladis,p. palffy-muhoray

Dynamics and defects in liquid crystals

By P. E. Cladis,P. Palffy-Muhoray

View Defects in Semiconductors By Lucia Romano,Vittorio Privitera,Chennupati Jagadish

Defects in Semiconductors

Defects in Semiconductors

By Lucia Romano,Vittorio Privitera,Chennupati Jagadish

View Particle control for semiconductor manufacturing By R. P. Donovan
Cover of Particle control for semiconductor manufacturing by r. p. donovan

Particle control for semiconductor manufacturing

By R. P. Donovan

View Corrosion of reinforcement in concrete construction By C. L. W. Page,P. B. Bamforth,J. W. Figg
Cover of Corrosion of reinforcement in concrete construction by c. l. w. page,p. b. bamforth,j. w. figg

Corrosion of reinforcement in concrete construction

By C. L. W. Page,P. B. Bamforth,J. W. Figg

View Colour centres and imperfections in insulators and semiconductors By P. D. Townsend
Cover of Colour centres and imperfections in insulators and semiconductors by p. d. townsend

Colour centres and imperfections in insulators and semiconductors

By P. D. Townsend

View Atomic diffusion in semiconductors By Shaw, D.
Cover of Atomic diffusion in semiconductors by shaw, d.

Atomic diffusion in semiconductors

By Shaw, D.