An edition of IWSM (1999)
IWSM
1999 4th International Workshop on Statistical Metrology : June 12, 1999, Kyoto
By International Workshop on Statistical Metrology (4th 1999 Kyoto, Japan),Institute of Electrical and Electronics Engineers,IEEE Electron Devices Society
0 (0 Ratings)
0 Want to read0 Currently reading0 Have read
0 Want to read0 Currently reading0 Have read
Publish Date
1999
Publisher
IEEE
Language
eng
Pages
65
Description:
subjects: Semiconductors, Congresses, Statistical methods, Characterization, Measurement, Mathematics for scientists & engineers, Weights & Measures, Mensuration, Electronic Measurements, Mathematics, Technology & Industrial Arts, Science/Mathematics, Probability & Statistics - General, Electronics - Semiconductors, Engineering - Electrical & Electronic, Science