CMOS Gate-Stack Scaling Vol. 1155

Materials, Interfaces and Reliability Implications

By Alexander A. Demkov,Taylor, Bill,H. Rusty Harris,Jeffery W. Butterbaugh,Willy Rachmady

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Publish Date

2014

Publisher

University of Cambridge ESOL Examinations

Language

eng

Pages

194

1-1 of 1 Editions

CMOS Gate-Stack Scaling Vol. 1155

Language: eng

Pages: 194

Published In: 2014

Publisher: University of Cambridge ESOL Examinations