CMOS Gate-Stack Scaling Vol. 1155
An edition of CMOS Gate-Stack Scaling Vol. 1155 (2014)
Materials, Interfaces and Reliability Implications
By Alexander A. Demkov,Taylor, Bill,H. Rusty Harris,Jeffery W. Butterbaugh,Willy Rachmady
Publish Date
2014
Publisher
University of Cambridge ESOL Examinations
Language
eng
Pages
194