Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
An edition of Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching (2006)
Application to Rough and Natural Surfaces
By Gerd Kaupp
Publish Date
2010
Publisher
Springer Berlin / Heidelberg
Language
eng
Pages
-
1-2 of 2 Editions
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Language: eng
Published In: 2010
Publisher: Springer Berlin / Heidelberg
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Language: eng
Published In: 2006
Publisher: Springer London, Limited