An edition of 1997 IEEE International Integrated Reliability Workshop final report (1997)
1997 IEEE International Integrated Reliability Workshop final report
Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997
By International Integrated Reliability Workshop (1997 Lake Tahoe, California)
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Publish Date
1997
Publisher
IEEE Electron Devices Society,IEEE Reliability Society
Language
eng
Pages
161
Description:
subjects: Reliability, Congresses, Integrated circuits, Wafer-scale integration