An edition of Proceedings of the Symposium on Reliability of Metals in Electronics (1995)
By Symposium on Reliability of Metals in Electronics (1995 Reno, Nev.)
Publish Date
1995
Publisher
Electrochemical Society
Language
eng
Pages
245
Description:
subjects: Congresses, Thin film devices, Reliability, Metallic films, Electric properties, Breakdown (Electricity), Electrodiffusion, Semiconductors