An edition of Influence of temperature on microelectronics and system reliability (1997)
Influence of Temperature on Microelectronics and System Reliability
A Physics of Failure Approach
By Pradeep Lall
Publish Date
2020
Publisher
Taylor & Francis Group
Language
eng
Pages
336
1-5 of 5 Editions
Influence of Temperature on Microelectronics and System Reliability
Language: eng
Published In: 2019
Publisher: Taylor & Francis Group
Influence of Temperature on Microelectronics and System Reliability
Language: eng
Pages: 336
Published In: 2020
Publisher: Taylor & Francis Group
Language: eng
Pages: 336
Published In: 2020
Publisher: Taylor & Francis Group
Influence of Temperature on Microelectronics and System Reliability
Language: eng
Pages: 336
Published In: 2020
Publisher: Taylor & Francis Group
Language: eng
Pages: 307
Published In: 1997
Publisher: CRC Press