An edition of 1994 International Integrated Reliability Workshop final report (1994)

1994 International Integrated Reliability Workshop final report

Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994

By International Integrated Reliability Workshop (1994 Lake Tahoe, Calif.)

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Publish Date

1994

Publisher

IEEE Electron Devices Society,IEEE Reliability Society

Language

eng

Pages

155

Description:

subjects: Congresses, Reliability, Integrated circuits, Wafer scale integration, Wafer-scale integration