An edition of Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits (2000)
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
By Michael L. Bushnell,Vishwani D. Agrawal
Publish Date
2000
Publisher
Kluwer Academic,Springer
Language
eng
Pages
701
Description:
subjects: Digital integrated circuits, Integrated circuits, Mixed signal circuits, Semiconductor storage devices, Testing, Very large scale integration, Electronic devices & materials, General Theory of Computing, Electronic Measurements, Very-Large-Scale Integration (Vlsi), Technology, Technology & Industrial Arts, Textbooks, Science/Mathematics, Electronics - Circuits - General, Engineering - Electrical & Electronic, General, Technology / Electronics / Circuits / General, Electronics - Circuits - VLSI, Integrated circuits, very large scale integration