New frontiers in testing

September 12, 13, 14, 1988 Sheraton Washington Hotel, Washington, DC

By International Test Conference (1988 Washington, D.C.)

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Publish Date

1988

Publisher

IEEE Computer Society Press

Language

eng

Pages

1005

Description:

subjects: Automatic test equipment, Circuits, Congresses, Electronic digital computers, Integrated circuits, Semiconductors, Testing