Spatially resolved characterization of local phenomena in materials and nanostructures

An edition of Spatially resolved characterization of local phenomena in materials and nanostructures (2003)

Spatially resolved characterization of local phenomena in materials and nanostructures

symposium held December 2-6, 2002, Boston, Massachusetts, U.S.A.

By Symposium G, "Spatially Resolved Characterization of Local Phenomena in Materials and Devices" (2002 Boston, Mass.)

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Publish Date

2003

Publisher

Materials Research Society

Language

eng

Pages

425

Description:

subjects: Characterization, Congresses, Nanostructured materials, Scanning probe microscopy, Semiconductors, Technique, Nanotechnology, Nanostructures