An automated photovoltaic system for the measurement of resistivity variations in high-resistivity circular silicon slices

An edition of An automated photovoltaic system for the measurement of resistivity variations in high-resistivity circular silicon slices (1979)

An automated photovoltaic system for the measurement of resistivity variations, in high-resistivity circular silicon slices

By David L. Blackburn

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Publish Date

1979

Publisher

U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.

Language

eng

Pages

Description:

subjects: Automation, Data processing, Electric properties, Equipment and supplies, Photoconductivity, Quality control, Semiconductor industry, Semiconductor wafers, Semiconductors, Silicon, Testing