Explore Books on
semiconductor wafers
1-24 of 108 Books
Crystal Growth and Evaluation of Silicon for VLSI and ULSI
By Golla Eranna
An automated photovoltaic system for the measurement of resistivity variations in high-resistivity circular silicon slices
An automated photovoltaic system for the measurement of resistivity variations in high-resistivity circular silicon slices
By David L. Blackburn
On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond
By Andrej Rumiantsev
Production Planning and Control for Semiconductor Wafer Fabrication Facilities
By Lars Mönch
National security assessment of the U.S. semiconductor wafer processing equipment industry
National security assessment of the U.S. semiconductor wafer processing equipment industry
By United States. Dept. of Commerce. Office of Industrial Resource Administration. Strategic Analysis Division.
Cleaning technology in semiconductor device manufacturing
By
Techniques and challenges for 300 mm silicon
By Symposium F on Techniques and Challenges for 300 mm Silicon (1998 Strasbourg, France)
Workshop on temperature measurement of semiconductor wafers using thermocouples
Workshop on temperature measurement of semiconductor wafers using thermocouples
By Workshop on Temperature Measurement of Semiconductor Wafers Using Thermocouples (2000 NIST)
1997 2nd International Symposium on Plasma Process-Induced Damage
By International Symposium on Plasma Process-Induced Damage (2nd 1997 Monterey, Calif.),Calif.) International Symposium on Plasma Process-Induced Damage (2nd : 1997 : Monterey,Kin P. Cheung,Moritaka Nakamura,Calvin T. Gabriel
The invention of the silicon chip
By Windsor Chorlton
Handbook of Semiconductor Wafer Cleaning Technology
By Werner Kern
1996 1st International Symposium on Plasma Process-Induced Damage
By International Symposium on Plasma Process-Induced Damage (1st 1996 Santa Clara, Calif.)
High-density magnetic recording and integrated magneto-optics
By James Bain
Proceedings of the Fifth International Symposium on High Purity Silicon
By International Symposium on High Purity Silicon (5th 1998 Boston, Mass.)
Silicon wafer bonding technology
By Subramanian S. Iyer
Ultraclean surface processing of silicon wafers
By S. Heusler
Noise temperature measurements on wafer
Noise temperature measurements on wafer
By J. Randa
Proceedings of the Second International Symposium on Semiconductor Wafer Bonding--Science, Technology, and Applications
By International Symposium on Semiconductor Wafer Bonding: Science, Technology, and Applications (2nd 1993 Honolulu, Hawaii)
Wafer scale integration, II
By IFIP WG 10.5 Workshop on Wafer Scale Integration (2nd 1987 Egham, England)
High purity silicon 9
High purity silicon 9
By International Symposium on High Purity Silicon (9th 2006 Cancún, Mexico)
Semiconductor wafer bonding
By Q.-Y Tong,U. Gösele
1999 4th International Symposium on Plasma Process-Induced Damage
By International Symposium on Plasma Process-Induced Damage (4th 1999 Monterey, Calif.)
Proceedings of the Symposium on Large Area Wafer Growth and Processing for Electronic and Photonic Devices and the Twentieth State-of-the Art Program on Compound Semiconductors (SOTAPOCS XX)
By Symposium on Large Area Wafer Growth and Processing for Electronic and Photonic Devices (1994 San Francisco, Calif.),S. A. Ringel,D. N. Buckley,J. P. Vilcot,C. Kusano,G. J. Valco