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Cover of 2001 6th International Workshop on Statistical Methodology

2001 6th International Workshop on Statistical Methodology

IWSM : June 10, 2001/Kyoto

By International Workshop on Statistical Methodology (6th 2001 Kyoto, Japan)

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Publish Date

2001

Publisher

IEEE

Language

eng

Pages

67

Description:

subjects: Characterization,  Congresses,  Measurement,  Semiconductors,  Statistical methods,  Integrated circuits,  Very large scale integration,  Defects,  Design and construction