

An edition of 2001 IEEE International Integrated Reliability Workshop Final Report (2002)
Stanford Sierra Camp, Lake Tahoe, California, October 15-18, 2001
By Calif.) International Integrated Reliability Workshop (2001 : Lake Tahoe
Publish Date
January 2002
Publisher
Inst Elect & Electronic Engineers
Language
eng
Pages
106
Description:
subjects: Integrated circuits, Congresses, Reliability, Wafer-scale integration