An edition of Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching (2006)
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Application to Rough and Natural Surfaces (NanoScience and Technology)
By G. Kaupp
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Publish Date
September 15, 2006
Publisher
Springer
Language
eng
Pages
292
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