An edition of Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching (2006)
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Application to Rough and Natural Surfaces (NanoScience and Technology)
By G. Kaupp
0 (0 Ratings)
0 Want to read0 Currently reading0 Have read
0 Want to read0 Currently reading0 Have read
Publish Date
September 15, 2006
Publisher
Springer
Language
eng
Pages
292
1-1 of 1 Editions
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and NanoscratchingApplication to Rough and Natural Surfaces (NanoScience and Technology)
Language: eng
Pages: 292
Published In: September 15, 2006
Publisher: Springer