An edition of Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II (2005)

Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II

2-4 August, 2005, San Diego, California, USA

By SPIE

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Publish Date

January 2005

Publisher

SPIE-International Society for Optical Engine

Language

eng

Pages

Description:

subjects: Optoelectronics, Congresses, Optoelectronic devices, Optical measurements, Semiconductors, Characterization, Thin films, Optical properties, Nanotechnology