An edition of Materials Reliability in Microelectronics V (Symposium Proceedings Series; Volume 391) (1995)
Materials Reliability in Microelectronics V (Symposium Proceedings Series; Volume 391)
By A. S. Oates
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Publish Date
January 1995
Publisher
Materials Research Society
Language
eng
Pages
523
Description:
subjects: Reliability, Congresses, Microstructure, Materials, Testing, Microelectronics, Electrodiffusion, Metallizing