

An edition of Electron-Beam, X-Ray, and Ion-Beam Technology (1990)
submicrometer lithographies IX : 7-8 March 1990, San Jose, California
By Douglas J. Resnick
Publish Date
1990
Publisher
SPIE--the International Society for Optical Engineering
Language
eng
Pages
344
1-2 of 2 Editions
Language: eng
Pages: 344
Published In: 1990
Publisher: SPIE--the International Society for Optical Engineering
Electron-Beam, X-Ray, and Ion-Beam Technology
Published In: December 1990
Publisher: SPIE-International Society for Optical Engine