An edition of Materials Reliability in Microelectronics III (1993)
Materials Reliability in Microelectronics III
Symposium Held April 12-15, 1993, San Francisco, California, U.S.A. (Materials Research Society Symposium Proceedings)
By Kenneth P. Rodbell
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Publish Date
October 1993
Publisher
Materials Research Society
Language
eng
Pages
505
Description:
subjects: Microelectronics, Diffusion, Reliability, Congresses, Materials, Testing, Electrodiffusion, Microstructure